Bruker-AXS High Resolution X-ray Diffractometer

The Bruker High resolution X-ray diffractometer is used to study the crystal structure of materials. The diffractometer has the following features:

Key Features:

• A Goeber mirror (40 mm length) to collimate the x-ray beam into a 0.8 mm wide parallel beam
• A 4-bounce monochromator further reduces the beam divergence down to 12 arcsec.
• A dual beam path analyzer detecting system (Variable slit or triple-axis analyzer)
• Quarter cradle with motorized X/Y/Z/Chi/Phi

Specifications:

Optics for primary beam	Divergence Angle	Beam Intensity
Goeber Mirror	110" (30 mdeg)	900 x 106 cps
Goeber Mirror + 4-bounce Ge (220) monochromator	12" (3.3 mdeg)	4.5 x 106 cps
Goeber Mirror + 4-bounce Ge (440) monochromator	5" (1.4 mdeg)	0.15 x 106 cps

Optics for diffracted beam	Divergence Angle
Varible slit	0.1 to 3 deg
Triple-axis (Ge 3-bounce) analyzer	12" (3.3 mdeg)

Drive	Smallest Step Size	Range
Theta	0.0001 deg	-4 deg to 170 deg
2Theta	0.0001 deg	-110 deg to 170 deg
Chi	0.01 deg	-11 deg to 98 deg
Phi	0.01 deg	unlimited
X/Y	0.01 mm	-40 mm to 40 mm
Z	0.01 mm	-0.9 mm to 2 mm